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Clays and Clay Minerals; June 1998; v. 46; no. 3; p. 301-316
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Analytical electron microscopy in clays and other phyllosilicates; loss of elements from a 90-nm stationary beam of 300-keV electrons

Chi Ma, John D. FitzGerald, Richard A. Eggleton, and David J. Llewellyn

Australian National University, Department of Geology, Canberra, Australia

Diffusion of alkali and low-atomic-number elements during the microbeam analysis of some silicates by analytical electron microscopy (AEM) has been known for some time. Our repeated analyses at 300 kV of kaolinite, halloysite, smectite, biotite, muscovite and pyrophyllite, however, showed differential loss (relative to Si) of not only alkali elements (such as K, Na, Mg) and low-atomic-number elements (such as Al) but also higher-atomic-number elements (such as Fe, Ti). For AEM of these phyllosilicates, a Philips EM430/EDAX facility with a tungsten filament was used to provide a current of 0.3 nA in a stationary beam of nominal diameter 90 nm. The loss of Al in kaolin minerals during analysis is particularly severe. Kaolin crystals can be damaged by the electron irradiation over several seconds, making it the most sensitive clay to the electron beam; in general, relative phyllosilicate stabilities are kaolin This record provided courtesy of AGI/GeoRef.




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