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1 TU Bergakademie Freiberg, Institute of Mineralogy, 09596 Freiberg, Germany
2 Clay and Interface Mineralogy, RWTH Aachen University, 52056 Aachen, Germany
3 Institute of Crystallography, RWTH Aachen University, 52056 Aachen, Germany
4 BGR/LBEG, 30655 Hannover, Germany
* E-mail address of corresponding author: kristian.ufer{at}bgr.de
Thirty six bentonite samples from 16 different locations were examined in order to demonstrate the applicability of a new Rietveld description approach for quantitative phase analysis. X-ray diffraction patterns of the bulk material were obtained and analyzed by the Rietveld method. The samples contain up to ten different minerals, with dioctahedral smectite as the major component. A model for turbostratic disorder of smectites was formulated inside a structure-description file of the Rietveld program BGMN. The quality of the refinements was checked using an internal standard mineral (10.0 or 20.0 wt.% corundum) and by cross-checking results with X-ray fluorescence (XRF) data. The corundum content was reproduced with only small deviations from the nominal values. A comparison of the chemical composition obtained by XRF and the composition as re-calculated from quantitative Rietveld results shows a satisfactory agreement, although X-ray amorphous components such as volcanic glasses were not considered. As a result of this study, the Rietveld method combined with the new structure model for turbostratic disorder has proven to be a suitable method for routine quantitative analysis of bentonites with smectites as the dominant clay minerals.
Key Words: Bentonite Quantification Rietveld Analysis Smectite
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